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The mission of Dimensional Metrology Standards Consortium (DMSC, Inc.) is to identify urgently needed standards in the field of dimensional metrology, and to promote, foster, and encourage the development and interoperability of these standards, along with related and supporting standards that will benefit the industry as a whole.  The Dimensional Measuring Interface Standard (DMIS) is one such standard that the consortium has the responsibility to develop, maintain and support as well as to coordinate and harmonize with other related standards efforts.  The DMSC is an ANSI Accredited Standards Developing Organization, as well as an A-Liaison to ISO.  The consortium invites participation within the consortium of other standards groups and activities that seek to resolve the technology and other issues of automated dimensional metrology.   Read more on DMSC.)
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New Book on Information Modeling for Interoperable Dimensional Metrology PDF Print E-mail
Gives readers an overview and in-depth understanding of a complete dimensional metrology system
▶ Enables readers to utilize basic theories and key technologies to solve the practical dimensional measurement problems in modern dimensional metrology practices
▶ Allows readers to integrate the information modeling techniques and data models described in the book with their own research work



Dimensional metrology is an essential part of modern manufacturing technologies,but the basic theories and measurement methods are no longer sufficient for today's digitized systems. The information exchange between the software components of a dimensional metrology system not only costs a great deal of money, but also causes the entire system to lose data integrity.Information Modeling for Interoperable Dimensional Metrology analyzes interoperability issues in dimensional metrology systems and describes information modeling techniques. It discusses new approaches and data models for solving interoperability problems, as well as introducing process activities, existing and emerging data models, and the key technologies of dimensional metrology systems. Written for researchers in industry and academia, as well as advanced undergraduate and postgraduate students, this book gives both an overview and an in-depth understanding of complete dimensional metrology systems. By covering in detail the theory and main content, techniques, and methods used in dimensional metrology systems, Information Modeling for Interoperable Dimensional Metrology enables readers to solve real-world dimensional measurement problems in modern dimensional metrology practices.

For more information, or to order a copy, click on the following Link:

www.springer.com/978-1-4471-2166-4


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Newsflash
New DMIS 5.2 Standard now available!
DMIS 5.2 APPROVED AS STANDARD

The new version of the Dimensional Measuring Interface Standard (DMIS), revision 5.2, has been completed and was approved by ANSI on August 4, 2009, as an American National Standard.  DMIS 5.2 includes multi-axis scanning capabilities along with many additional enhancements.  Orders are now being accepted for the new DMIS Standard via our Online Store.  To order your copy, and learn more about DMIS 5.2, click on this link to our Online Store.






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